Trends such as the miniaturization of products and higher production speeds lead to increasingly complex challenges for manufacturers of semiconductor components. They must keep a close eye on the cost-efficiency of their processes to remain competitive.

Anyone aiming to manufacture wafers cost-effectively must ensure high yield in production. It is therefore essential to detect yield-reducing defects as early as possible in order to adapt further processing and avoid unnecessary costs from performing production steps on already defective components.

This White Paper aims to highlight the technical possibilities of machine vision in the semiconductor industry and present solutions for this specific area of application.

You will learn more about:

• Challenges of wafer inspection
• Macro defects detection
• Line scan camera technology
• Lighting solutions