The allPIXA pro, allPIXA wave and allPIXA evo camera can be used to trigger up to four different flash controller channels synchronized to its line acquisition. This can be used to acquire several images with different illumination geometries and/or colors (white, red, green, UV, IR) simultaneously in only one scan by line-multiplexing.
Capturing yield limiting defects is crucial for semiconductor wafer devices yield. Here we describe how semiconductor wafer manufacturing can take advantage of its ultra-high resolution 15,360 pixels and rich features to advantage of in-line inspection systems allPIXA wave Trilinear color and mono TDI line scan camera.
The Chromasens 3DPIXA pro dual 30µm combines modern line scan camera technology with fast 3D stereo computation on graphics cards. The stereo line scan camera delivers 3D data and colour images simultaneously. This technology allows the use of lighting that is optimized for the application.
Capturing yield limiting defects is crucial for semiconductor wafer devices yield. Here we describe how semiconductor wafer manufacturing can take advantage of its ultra-high resolution 15,360 pixels and rich features to advantage of in-line inspection systems allPIXA wave Trilinear color and mono TDI line scan camera.
The white paper gives a general overview as well as to function as a reference for all tasks related to synchronizing allPIXA classic, allPIXA pro and allPIXA wave cameras.
The white paper gives a general overview as well as to function as a reference for all tasks related to synchronizing allPIXA classic, allPIXA pro and allPIXA wave cameras.
Chromasens 3DPIXA wave dual 30µm combines line scan camera technology with fast 3D stereo computation on graphics cards. The stereo camera delivers 3D data and colour images simultaneously.
Chromasens 3DPIXA wave dual 10µm combines state-of-the-art line scan camera technology with fast 3D stereo computation on graphics cards. The stereo line scan camera delivers 3D data and colour images simultaneously.
3DPIXA pro dual 70µm f/11 combines state-of-the-art line scan camera technology with fast 3D stereo computation on graphics cards and delivers 3D data and colour images simultaneously.
This report is an example how to use a 3DPixa and the 3DAPI to implement a measuring task for connectors.
