Application Challenges
- High precision measurement of 3D shape and height of each single BGA
- Substrate surface contamination and defect detection
- 100% Inline inspection
- Fastest speed, high production throughput
3D Solution
- 3DPIXA dual
- Combined illumination: diffuse tube light + bright field + dark field
- GPU accelerated high speed 3D data reconstruction
- High precision measurement
- Scalable large FOV from 35 to 150mm
- High dynamic range
- BGA height and shape measurement
- Bright field + dark field illumination based substrate surface inspection
- Little occlusion compared to laser triangulation