allPIXA neo is the new multispectral camera series in the Chromasens allPIXA family.
With its small size and a quadlinear CMOS sensor, which in addition to RGB also creates a mono and NIR image in 4k and 6k resolution, this small power cube offers versatile possibilities for inspection tasks at high speed.
Capturing yield limiting defects is crucial for semiconductor wafer devices yield. Here we describe how semiconductor wafer manufacturing can take advantage of its ultra-high resolution 15,360 pixels and rich features to advantage of in-line inspection systems allPIXA wave Trilinear color and mono TDI line scan camera.
The white paper gives a general overview as well as to function as a reference for all tasks related to synchronizing allPIXA classic, allPIXA pro and allPIXA wave cameras.
This white paper gives a comprehensive overview on the limitations of the block-matching approach in height reconstruction for passive stereoscopy. It describes a variety of different artefacts that appear at certain image features.