allPIXA neo - the new multispectral camera with 4k and 6k resolution

Thu, 2023-09-07

allPIXA neo is the new multispectral camera series in the Chromasens allPIXA family.

With its small size and a quadlinear CMOS sensor, which in addition to RGB also creates a mono and NIR image in 4k and 6k resolution, this small power cube offers versatile possibilities for inspection tasks at high speed.


TechTalk Webinars

Mon, 2021-03-08

We are participating in 4 TechTalk webinars on machine vision, 3D metrology and embedded vision.

First Chromasens SWIR camera

Fri, 2020-12-11

The allPIXA SWIR is the first short-wave infrared (SWIR) line scan camera in Chromasens' allPIXA family.

Technical Note - Semiconductor wafer inspection using allPIXA wave

Wed, 2020-06-03

Capturing yield limiting defects is crucial for semiconductor wafer devices yield. Here we describe how semiconductor wafer manufacturing can take advantage of its ultra-high resolution 15,360 pixels and rich features to advantage of in-line inspection systems allPIXA wave Trilinear color and mono TDI line scan camera.

Connector pin inspection

Thu, 2020-05-07

This report is an example how to use a 3DPixa and the 3DAPI to implement a measuring task for connectors.

New Technical Note

Mon, 2020-01-20

This technical note is about an alternative 3D reconstruction method.

New White Paper

Thu, 2020-01-09

This white paper gives a comprehensive overview on the limitations of the block-matching approach in height reconstruction for passive stereoscopy. It describes a variety of different artefacts that appear at certain image features.