News

We are participating in 4 TechTalk webinars on machine vision, 3D metrology and embedded vision.

We are proud to introduce our newest camera: the allPIXA evo 8k!

The allPIXA SWIR is the first short-wave infrared (SWIR) line scan camera in Chromasens' allPIXA family.

Read the complete brochure in English here & in Mandarin here

Capturing yield limiting defects is crucial for semiconductor wafer devices yield. Here we describe how semiconductor wafer manufacturing can take advantage of its ultra-high resolution 15,360 pixels and rich features to advantage of in-line inspection systems allPIXA wave Trilinear color and mono TDI line scan camera.

The white paper gives a general overview as well as to function as a reference for all tasks related to synchronizing allPIXA classic, allPIXA pro and allPIXA wave cameras.

This report is an example how to use a 3DPixa and the 3DAPI to implement a measuring task for connectors.

A statement by Peter Tix about measures taken by Chromasens to secure deliveries during the COVID-19 crisis.

This technical note is about an alternative 3D reconstruction method.

This white paper gives a comprehensive overview on the limitations of the block-matching approach in height reconstruction for passive stereoscopy. It describes a variety of different artefacts that appear at certain image features.