News

We are participating in 4 TechTalk webinars on machine vision, 3D metrology and embedded vision.

We are proud to introduce our newest camera: the allPIXA evo 8k!

The allPIXA SWIR is the first short-wave infrared (SWIR) line scan camera in Chromasens' allPIXA family.

Capturing yield limiting defects is crucial for semiconductor wafer devices yield. Here we describe how semiconductor wafer manufacturing can take advantage of its ultra-high resolution 15,360 pixels and rich features to advantage of in-line inspection systems allPIXA wave Trilinear color and mono TDI line scan camera.

The white paper gives a general overview as well as to function as a reference for all tasks related to synchronizing allPIXA classic, allPIXA pro and allPIXA wave cameras.

This report is an example how to use a 3DPixa and the 3DAPI to implement a measuring task for connectors.

This technical note is about an alternative 3D reconstruction method.

This white paper gives a comprehensive overview on the limitations of the block-matching approach in height reconstruction for passive stereoscopy. It describes a variety of different artefacts that appear at certain image features.

Line-based stereo vision system checks ball and roller bearings. Read the whole case study here.

Quality control within package printing processes is one of the key fields of application of fast, high-performance color line scan cameras. To this end, Irish machine vision specialist OneBoxVision has developed an "out of the box" solution for 100% inline inspection.