GCT 2.4.0 Update - New Features!
We have updated our GCT2. Read more to check out its' new Features.
We are participating in 4 TechTalk webinars on machine vision, 3D metrology and embedded vision.
First Chromasens SWIR camera
The allPIXA SWIR is the first short-wave infrared (SWIR) line scan camera in Chromasens' allPIXA family.
Technical Note - Semiconductor wafer inspection using allPIXA wave
Capturing yield limiting defects is crucial for semiconductor wafer devices yield. Here we describe how semiconductor wafer manufacturing can take advantage of its ultra-high resolution 15,360 pixels and rich features to advantage of in-line inspection systems allPIXA wave Trilinear color and mono TDI line scan camera.
Whitepaper - Synchronizing modes of allPIXA classic, pro and wave
The white paper gives a general overview as well as to function as a reference for all tasks related to synchronizing allPIXA classic, allPIXA pro and allPIXA wave cameras.
Connector pin inspection
This report is an example how to use a 3DPixa and the 3DAPI to implement a measuring task for connectors.
New White Paper
This white paper gives a comprehensive overview on the limitations of the block-matching approach in height reconstruction for passive stereoscopy. It describes a variety of different artefacts that appear at certain image features.
New customer story
Line-based stereo vision system checks ball and roller bearings. Read the whole case study here.