News

TechTalk Webinars

We are participating in 4 TechTalk webinars on machine vision, 3D metrology and embedded vision.

Technical Note - Semiconductor wafer inspection using allPIXA wave

Capturing yield limiting defects is crucial for semiconductor wafer devices yield. Here we describe how semiconductor wafer manufacturing can take advantage of its ultra-high resolution 15,360 pixels and rich features to advantage of in-line inspection systems allPIXA wave Trilinear color and mono TDI line scan camera.

Connector pin inspection

This report is an example how to use a 3DPixa and the 3DAPI to implement a measuring task for connectors.

COVID-19 Statement

A statement by Peter Tix about measures taken by Chromasens to secure deliveries during the COVID-19 crisis.

New White Paper

This white paper gives a comprehensive overview on the limitations of the block-matching approach in height reconstruction for passive stereoscopy. It describes a variety of different artefacts that appear at certain image features.